Efficient Way Of Testing H.323 Features And Predicting SIP Stack Failure

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Category: 
Part1
Author: 
Mr. Brijesh Kumar N. Khundhawala, ME IT Student, MIT College Of Engineering, Pune
Prof. Priya Deshpande, Associate Professor, MIT College Of Engineering, Pune
Abstract: 

An H.323 telephony system is vulnerable to various talk path failure or breakage which leads the customer to generate a request to solve the issue. Developers need to fix the issue as quick as possible. After fixing the issue, they need an efficient way to test the change. Till now testing framework has rarely been addressed for H.323 features which is a very important activity before delivery. Here we propose a new framework which leads to an efficient and quick way of testing H.323 features over the network. This framework will automate the testing and is assumed to work 20 times faster. This framework also proposes a technique which will help predicting SIP messages which can cause SIP STACK failure in PBX and which can pull the entire communication system down. So knowing this in advance will help developers to fix the same before delivery to the customer. So this proposed framework is much needed in the telecom industry for faster and efficient delivery of patches for the telecom system.

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